Micro-Raman-scattering study of stress distribution in GaN...

Micro-Raman-scattering study of stress distribution in GaN films grown on patterned Si(111) by metal-organic chemical-vapor deposition

Wang, D., Jia, S., Chen, K. J., Lau, K. M., Dikme, Y., van Gemmern, P., Lin, Y. C., Kalisch, H., Jansen, R. H., Heuken, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1856211
File:
PDF, 449 KB
english, 2005
Conversion to is in progress
Conversion to is failed