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Micro-Raman-scattering study of stress distribution in GaN films grown on patterned Si(111) by metal-organic chemical-vapor deposition
Wang, D., Jia, S., Chen, K. J., Lau, K. M., Dikme, Y., van Gemmern, P., Lin, Y. C., Kalisch, H., Jansen, R. H., Heuken, M.Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1856211
File:
PDF, 449 KB
english, 2005