![](/img/cover-not-exists.png)
[IEEE IEEE Custom Integrated Circuits Conference - CICC '93 - San Diego, CA, USA (9-12 May 1993)] Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93 - A new efficient transient noise analysis technique for simulation of CCD image sensors or particle detectors
Bolcato, P., Tawfik, M.S., Poujois, R., Jarron, P.Year:
1993
Language:
english
DOI:
10.1109/cicc.1993.590717
File:
PDF, 378 KB
english, 1993