Comparative study of defect evolution in carbon implanted strained SiGe and SiSn layers
Gaiduk, Peter I., Lundsgaard Hansen, John, Nylandsted Larsen, Arne, Skorupa, WolfgangVolume:
12
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201400135
Date:
January, 2015
File:
PDF, 390 KB
english, 2015