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Deep-submicrometre fully-depleted SOI MOSFET drain current model for digital/analogue circuit simulation
HU, MAN-CHUN, JANG, SHENG-LYANGVolume:
84
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/002072198134779
Date:
March, 1998
File:
PDF, 328 KB
english, 1998