Defects in N/Ge coimplanted GaN studied by positron...

Defects in N/Ge coimplanted GaN studied by positron annihilation

Nakano, Yoshitaka, Kachi, Tetsu
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Volume:
91
Year:
2002
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1421627
File:
PDF, 283 KB
english, 2002
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