Characterization of insulators by high-resolution...

Physical Review B 1986 / 4 Vol. 33; Iss. 8

Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique

Liehr, M., Thiry, P. A., Pireaux, J. J., Caudano, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.33.5682
Date:
April, 1986
File:
PDF, 1.49 MB
english, 1986
Conversion to is in progress
Conversion to is failed