[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions
Wu, J., Juliano, P., Rosenbaum, E.Year:
2000
Language:
english
DOI:
10.1109/eosesd.2000.890088
File:
PDF, 701 KB
english, 2000