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Stress-migration related electromigration damage mechanism...

Stress-migration related electromigration damage mechanism in passivated, narrow interconnects

Li, C.-Y., Bo̸rgesen, P., Sullivan, T. D.
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Volume:
59
Year:
1991
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.105289
File:
PDF, 726 KB
english, 1991
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