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Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope
Marti, O.Volume:
6
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.575191
Date:
May, 1988
File:
PDF, 573 KB
english, 1988