[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Early-stage determination of current-density criticality in interconnects
Jerke, Goran, Lienig, JensYear:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450505
File:
PDF, 290 KB
english, 2010