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A Nonvolatile InGaZnO Charge-Trapping-Engineered Flash Memory With Good Retention Characteristics
Nai-Chao Su,, Shui Jinn Wang,, Chin, A.Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2037986
Date:
March, 2010
File:
PDF, 157 KB
english, 2010