[IEEE GaAs IC Symposium. 25th Annual Technical Digest 2003 - San Diego, CA, USA (2003.11.9-2003.11.12)] 25th Annual Technical Digest 2003. IEEE Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. - Low frequency noise - based monitoring of the effects of RF and DC stress on AlGaN/GaN MODFETs

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