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[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - An Overview of the Open Architecture Test System
Rajsuman, R.Year:
2004
Language:
english
DOI:
10.1109/delta.2004.10026
File:
PDF, 130 KB
english, 2004