[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Corrosion of the Cu/Al interface in Cu-Wire-bonded integrated circuits
Osenbach, John, Wang, B Q, Emerich, Sue, DeLucca, John, Meng, DongmeiYear:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575782
File:
PDF, 3.10 MB
english, 2013