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Thickness and grain size dependence of the strength of copper thin films as investigated with bulge tests and nanoindentations
Merle, Benoit, Schweitzer, Elmar W., Göken, MathiasVolume:
92
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786435.2012.685773
Date:
September, 2012
File:
PDF, 1.30 MB
english, 2012