Thickness and grain size dependence of the strength of...

Thickness and grain size dependence of the strength of copper thin films as investigated with bulge tests and nanoindentations

Merle, Benoit, Schweitzer, Elmar W., Göken, Mathias
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Volume:
92
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786435.2012.685773
Date:
September, 2012
File:
PDF, 1.30 MB
english, 2012
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