[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Automated silicon debug data analysis techniques for a hardware data acquisition environment
Yang, Yu-Shen, Keng, Brian, Nicolici, Nicola, Veneris, Andreas, Safarpour, SeanYear:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450506
File:
PDF, 5.35 MB
english, 2010