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[IEEE 2014 18th International Symposium on VLSI Design and Test (VDAT) - Coimbatore, India (2014.7.16-2014.7.18)] 18th International Symposium on VLSI Design and Test - Operation-aware assist circuit design for improved write performance of FinFET based SRAM
Prajapati, Ekta, Yadav, Nandakishor, Pattanaik, Manisha, Sharma, G. K.Year:
2014
Language:
english
DOI:
10.1109/isvdat.2014.6881063
File:
PDF, 554 KB
english, 2014