[IEEE 2012 IEEE International Electron Devices Meeting...

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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Threshold Vacuum Switch (TVS) on 3D-stackable and 4F2 cross-point bipolar and unipolar resistive random access memory

Ho, ChiaHua, Huang, Hsin-Hau, Lee, Ming-Taou, Hsu, Cho-Lun, Lai, Tung-Yen, Chiu, Wen-Cheng, Lee, MeiYi, Chou, Tong-Huan, Yang, Ivy, Chen, Min-Cheng, Wu, Cheng-San, Chiang, Kuang-Hao, Yao, Yong-Der, Hu
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Year:
2012
Language:
english
DOI:
10.1109/iedm.2012.6478968
File:
PDF, 1.35 MB
english, 2012
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