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[IEEE 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 - Fort Worth, TX, USA (2014.03.16-2014.03.20)] 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 - Data driven modeling and verification for silicon carbide JFET with thermal effects

Li-gang, Ruan, Ping, Zhu, Li, Wang
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Year:
2014
Language:
english
DOI:
10.1109/apec.2014.6803678
File:
PDF, 1.57 MB
english, 2014
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