[IEEE 2010 IEEE 26th Symposium on Mass Storage Systems and Technologies (MSST) - Incline Village, NV, USA (2010.05.3-2010.05.7)] 2010 IEEE 26th Symposium on Mass Storage Systems and Technologies (MSST) - Delayed partial parity scheme for reliable and high-performance flash memory SSD
Im, Soojun, Shin, DongkunYear:
2010
Language:
english
DOI:
10.1109/msst.2010.5496997
File:
PDF, 195 KB
english, 2010