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[IEEE 2007 IEEE International Conference on Automation Science and Engineering - Scottsdale, AZ, USA (2007.09.22-2007.09.25)] 2007 IEEE International Conference on Automation Science and Engineering - A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime
Jin, Tongdan, Belkhouche, Fethi, Sung, Chen-HanYear:
2007
Language:
english
DOI:
10.1109/coase.2007.4341712
File:
PDF, 247 KB
english, 2007