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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Cross-layer resilience challenges: Metrics and optimization
Mitra, Subhasish, Brelsford, Kevin, Sanda, Pia NYear:
2010
Language:
english
DOI:
10.1109/date.2010.5456961
File:
PDF, 589 KB
english, 2010