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[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Hot-Swapping Architecture with Back-biased Testing for Mitigation of Permanent Faults in Functional Unit Array
Rakossy, Zoltan Endre, Hiromoto, Masayuki, Tsutsui, Hiroshi, Sato, Takashi, Nakamura, Yukihiro, Ochi, HiroyukiYear:
2013
Language:
english
DOI:
10.7873/date.2013.120
File:
PDF, 1.27 MB
english, 2013