Determination of the structural and optical characteristics of Cu2ZnSnS4semiconductor thin films
Sheleg, A. U., Hurtavy, V. G., Mudryi, A. V., Valakh, M. Ya., Yukhymchuk, V. O., Babichuk, I. S., Leon, M., Caballero, R.Volume:
48
Language:
english
Journal:
Semiconductors
DOI:
10.1134/s1063782614100273
Date:
October, 2014
File:
PDF, 459 KB
english, 2014