[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - EOS/ESD reliability of deep sub-micron NMOS protection devices
Ramaswamy, S., Duvvury, C., Sung-Mo Kang,Year:
1995
Language:
english
DOI:
10.1109/relphy.1995.513693
File:
PDF, 1.34 MB
english, 1995