Frequency modulation atomic force microscopy in ambient environments utilizing robust feedback tuning
Kilpatrick, J. I., Gannepalli, A., Cleveland, J. P., Jarvis, S. P.Volume:
80
Year:
2009
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3073964
File:
PDF, 783 KB
english, 2009