![](/img/cover-not-exists.png)
Stability of Si-Interstitial Defects: From Point to Extended Defects
Kim, Jeongnim, Kirchhoff, Florian, Wilkins, John W., Khan, Furrukh S.Volume:
84
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.84.503
Date:
January, 2000
File:
PDF, 418 KB
english, 2000