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Temperature-Frequency Scaling in Amorphous Niobium-Silicon near the Metal-Insulator Transition
Lee, Hok-Ling, Carini, John P., Baxter, David V., Grüner, GeorgeVolume:
80
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/physrevlett.80.4261
Date:
May, 1998
File:
PDF, 125 KB
english, 1998