ESD Detection Circuit and Associated Metal Fuse...

IEEE Transactions on Device and Materials Reliability 2014 / 03 Vol. 14; Iss. 1

ESD Detection Circuit and Associated Metal Fuse Investigations in CMOS Processes

Kuhn, William B., Eatinger, Ryan J., Melton, Steven A.
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2296750
Date:
March, 2014
File:
PDF, 1.35 MB
english, 2014
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