![](/img/cover-not-exists.png)
[IEEE 20th Annual IEEE Conference on Computational Complexity (CCC'05) - San Jose, CA, USA (11-15 June 2005)] 20th Annual IEEE Conference on Computational Complexity (CCC'05) - Tolerant Versus Intolerant Testing for Boolean Properties
Fischer, E., Fortnow, L.Year:
2005
Language:
english
DOI:
10.1109/ccc.2005.30
File:
PDF, 149 KB
english, 2005