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[IEEE 20th Annual IEEE Conference on Computational Complexity (CCC'05) - San Jose, CA, USA (11-15 June 2005)] 20th Annual IEEE Conference on Computational Complexity (CCC'05) - Tolerant Versus Intolerant Testing for Boolean Properties

Fischer, E., Fortnow, L.
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Year:
2005
Language:
english
DOI:
10.1109/ccc.2005.30
File:
PDF, 149 KB
english, 2005
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