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[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Analysis and reduction of glitches in synchronous networks
Leijten, J., van Meerbergen, J., Jess, J.Year:
1995
Language:
english
DOI:
10.1109/edtc.1995.470365
File:
PDF, 535 KB
english, 1995