[IEEE 2014 15th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2014.03.3-2014.03.5)] Fifteenth International Symposium on Quality Electronic Design - Assessing uniqueness and reliability of SRAM-based Physical Unclonable Functions from silicon measurements in 45-nm bulk CMOS
Fujiwara, Hidehiro, Yabuuchi, Makoto, Nii, KojiYear:
2014
Language:
english
DOI:
10.1109/isqed.2014.6783371
File:
PDF, 430 KB
english, 2014