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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Influence of GaN cap on robustness of AlGaN/GaN HEMTs
Ivo, Ponky, Glowacki, Arkadiusz, Pazirandeh, Reza, Bahat-Treidel, Eldad, Lossy, Richard, Wurfl, Joachim, Boit, Christian, Trankle, GuntherYear:
2009
Language:
english
DOI:
10.1109/irps.2009.5173226
File:
PDF, 764 KB
english, 2009