[IEEE Industrial Conference - Practice and Research Techniques (TAIC PART) - Windsor, UK (2008.08.29-2008.08.31)] Testing: Academic & Industrial Conference - Practice and Research Techniques (taic part 2008) - Alternating GUI Test Generation and Execution
Yuan, Xun, Memon, Atif M.Year:
2008
Language:
english
DOI:
10.1109/taic-part.2008.10
File:
PDF, 290 KB
english, 2008