Testing Methodology of Embedded DRAMs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2012 / 09 Vol. 20; Iss. 9

Testing Methodology of Embedded DRAMs

Yang, Hao-Yu, Chang, Chi-Min, Chao, Mango C.-T., Huang, Rei-Fu, Lin, Shih-Chin
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Volume:
20
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2011.2161785
Date:
September, 2012
File:
PDF, 1.96 MB
english, 2012
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