A cross-sectional transmission electron microscopy study of...

Journal of Applied Physics 1984 Vol. 55; Iss. 6

A cross-sectional transmission electron microscopy study of silicide growth kinetics in the Cr/(100)Si system at 425 °C

Natan, Menachem, Duncan, S. W., Byer, N. E.
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Volume:
55
Year:
1984
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.333399
File:
PDF, 488 KB
english, 1984
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