[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Predictive compact modeling of HQS effects and thermal noise in 90nm mixed signal/RF CMOS technology
Wei-Kai Shih,, Mudanai, S., Rios, R., Packan, P., Becher, D., Basco, R., Celia Hung,, Jalan, U.Year:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419280
File:
PDF, 265 KB
english, 2004