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Evaluation of heuristics for a class-constrained lot-to-order matching problem in semiconductor manufacturing
Boushell, Thomas G., Fowler, John W., Keha, Ahmet B., Knutson, Kraig R., Montgomery, Douglas C.Volume:
46
Language:
english
Journal:
International Journal of Production Research
DOI:
10.1080/00207540601001650
Date:
June, 2008
File:
PDF, 225 KB
english, 2008