On contrast parameters and topographic artifacts in near-field infrared microscopy
Palanker, D. V., Simanovskii, D. M., Huie, P., Smith, T. I.Volume:
88
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1321792
File:
PDF, 667 KB
english, 2000