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[IEEE 2006 Design Automation Conference - San Francisco, CA, USA ()] 2006 43rd ACM/IEEE Design Automation Conference - Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
Chao, M.C.-T., Kwang-Ting Cheng,, Seongmoon Wang,, Chakradhar, S., Wen-Long Wei,Year:
2006
Language:
english
DOI:
10.1109/dac.2006.229401
File:
PDF, 2.12 MB
english, 2006