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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Mutation analysis with high-level decision diagrams
Hantson, Hanno, Raik, Jaan, Jenihhin, Maksim, Chepurov, Anton, Ubar, Raimund, di Guglielmo, Giuseppe, Fummi, FrancoYear:
2010
Language:
english
DOI:
10.1109/latw.2010.5550336
File:
PDF, 427 KB
english, 2010