[IEEE 14th Asian Test Symposium (ATS'05) - Calcutta, India (2005.12.21-2005.12.21)] 14th Asian Test Symposium (ATS'05) - Flash Memory Die Sort by a Sample Classification Method
Dawn, Y.-C., Jen-Chieh Yeh,, Cheng-Wen Wu,, Chia-Ching Wang,, Yung-Chen Lin,, Chao-Hsun Chen,Year:
2005
Language:
english
DOI:
10.1109/ats.2005.61
File:
PDF, 214 KB
english, 2005