X-ray photoelectron diffraction at high angular resolution
Osterwalder, J., Stewart, E. A., Cyr, D., Fadley, C. S., Mustre de Leon, J., Rehr, J. J.Volume:
35
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.35.9859
Date:
June, 1987
File:
PDF, 224 KB
english, 1987