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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Comparative study on delay degrading estimation due to NBTI with circuit/instance/transistor-level stress probability consideration
Konoura, Hiroaki, Mitsuyama, Yukio, Hashimoto, Masanori, Onoye, TakaoYear:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450508
File:
PDF, 7.85 MB
english, 2010