Doping-Type Dependence of Damage in Silicon Diodes Exposed to X-Ray, Proton, and He$^{+}$ Irradiations
Caussanel, M., Canals, A., Dixit, S. K., Beck, M. J., Touboul, A. D., Schrimpf, R. D., Fleetwood, D. M., Pantelides, S. T.Volume:
54
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2007.909021
Date:
December, 2007
File:
PDF, 825 KB
english, 2007