[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot carrier induced emitter junction degradation of AlGaAs/GaAs HBTs
Chung Kun Song,, Duk Young Kim,, Do Hyun Kim,, Jae Hoon Choi,Year:
1997
Language:
english
DOI:
10.1109/ipfa.1997.638240
File:
PDF, 359 KB
english, 1997