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Application of near-field scanning microwave microprobe to...

Application of near-field scanning microwave microprobe to electrical current density mapping

Aga, Roberto S., Wang, Xiang, Dizon, Jonathan, Noffsinger, Jesse, Wu, Judy Z.
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Volume:
86
Year:
2005
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1941452
File:
PDF, 581 KB
english, 2005
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