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[IEEE 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Munich, Germany (2007.09.24-2007.09.28)] 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Predicting the immunity of integrated circuits through measurement methods and simulation models
Alaeldine, Ali, Cordi, Jerome, Perdriau, Richard, Ramdani, Mohamed, Levant, Jean-LucYear:
2007
Language:
english
DOI:
10.1109/emczur.2007.4388200
File:
PDF, 312 KB
english, 2007