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Low frequency noise in GaN metal semiconductor and metal oxide semiconductor field effect transistors
Rumyantsev, S. L., Pala, N., Shur, M. S., Gaska, R., Levinshtein, M. E., Khan, M. Asif, Simin, G., Hu, X., Yang, J.Volume:
90
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1372364
File:
PDF, 308 KB
english, 2001