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[IEEE 2013 IEEE International Conference on Imaging Systems and Techniques (IST) - Beijing, China (2013.10.22-2013.10.23)] 2013 IEEE International Conference on Imaging Systems and Techniques (IST) - Three-dimensional electrical capacitance tomography measurement system based on an impedance analyzer
Zhou, Yinggang, Liu, DeLong, Yan, HuaYear:
2013
Language:
english
DOI:
10.1109/ist.2013.6729733
File:
PDF, 527 KB
english, 2013